Automatic Wafer Thickness Meter

• Suitable for thickness and resistivity testing of materials such as semiconductor silicon wafers, silicon carbide wafers, gallium nitride wafers, sapphire substrate, potassium oxide, gallium arsenide chip, aluminum nitride, lithium tantalate and lithium niobate chips, etc.

Order phone：+86-15303718061

E-mail：sales@henuo-tech.com